Current work of design, manufactoring and measurement of cryogenic Low Noise Amplifiers of the MPIfR technology group will be presented. As part of a partnership with the IAF, a project has been started to develop cryogenic LNAs - called "Cryo mHEMT Project". Results of completed LNA designs and measurements will be presented. Within the Cryo mHEMT Project a on-wafer prober station was developed at the MPIfR to enable large volume semi-automated cryogenic measurement of noise and S-parameters at cryogenic temperatures. The developed system is capable of characterizing several 100 MMICs and Transistors on-wafer during a single cooling cycle at a temperature of ~12K. The setup of the system and the procedure of the MMIC measurements with the on-wafer prober will be shown.